Matthew C Reeck MD

Dermatologic Surgery

Physician

191 W 5th StKetchum, ID 83340
Phone+1 208-725-2171
Fax+1 812-331-0196

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Summary

Matthew Reeck, MD, is a dermatologist based in Hailey, ID, with a subspecialty in Dermatologic Surgery. He completed his internship at the University of Hawaii and his dermatology residency at Indiana University School of Medicine. Dr. Reeck possesses expertise in dermatologic and mohs micrographic surgery. He is board certified by the American Board of Dermatology in Dermatology & Micrographic Dermatologic Surgery. He has contributed to dermatological literature with works like "The diagnostic yield in submitting nevi for histologic examination," published in the Journal of the American Academy of Dermatology. Alongside his professional accomplishments, Dr. Reeck has been honored with the CMS Meaningful Use Stage 1 Certification from EpicCare Ambulatory EMR. He is a fellow of both the American Academy of Dermatology (FAAD) and the American Society for Dermatologic Surgery (FASDS).

Education & Training

Indiana University School of MedicineResidency, Dermatology, 1998 - 2001
University of HawaiiInternship, Transitional Year, 1997 - 1998
Indiana University School of MedicineClass of 1997

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Certifications & Licensure

ID State Medical License 2013 - 2027
IN State Medical License 2001 - 2025
HI State Medical License 1997 - 1998
American Board of Dermatology Dermatology

Awards, Honors, & Recognition

CMS Meaningful Use Stage 2 Certification EpicCare Ambulatory 2014 Certified EHR Suite, Epic Systems Corporation, 2014-2017
CMS Meaningful Use Stage 1 Certification EpicCare Ambulatory 2014 Certified EHR Suite, Epic Systems Corporation, 2014-2017
CMS Meaningful Use Stage 1 Certification EpicCare Ambulatory - Core EMR, Epic Systems Corporation, 2014-2017

Publications & Presentations

PubMed

23 citations
The diagnostic yield in submitting nevi for histologic examination.
Matthew C. Reeck, Tsu-Yi Chuang, Thomas J. Eads, Holly B. Faust, Evan R. Farmer
Journal of the American Academy of Dermatology. 1999-04-01